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Positron annihilation study on ZnO-based scintillating glasses

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Abstract.
Positron lifetime of ZnO-based scintillating glasses (55  x)SiO2–45ZnO–xBaF2 (x = 5, 10, 15 mol%) were
measured with a conventional fast–fast spectrometer. Three positron lifetime components t1, t2, and t3
are - 0.23 ns, - 0.45 ns, and - 1.6 ns, respectively. All the three positron lifetime components first
increase with increasing BaF2 concentration from 5 mol% to 10 mol%, then decreases as BaF2 further
increases to 15 mol%. The result suggests that the glass sample with 10 mol% BaF2 contains the highest
defect density, and is in excellent agreement with glass chemistry, glass density, thermal properties, and
calculated crystallinity. Therefore, positron annihilation lifetime measurement is an effective tool for
analyzing defects in ZnO-based scintillating glasses.

Keywords: Defects, Lifetime, Glass, ZnO, Nuclear applications

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Informasi Detail

Judul Seri

Applied Surface Science

No. Panggil

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Penerbit

London : Elsevier B.V.., 2009

Deskripsi Fisik

Applied Surface Science 255 (2009) 6551–6554

Bahasa

English

ISBN/ISSN

-

Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

-

Edisi

-

Subjek

KIMIA

Info Detail Spesifik

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Pernyataan Tanggungjawab

agus

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