e-journal
Frictional behaviour of vertically aligned carbon nanotube films
Abstract.
Vertically aligned CNT films were grown on polycrystalline b-SiC wafers by the surface
decomposition method. Their frictional behaviours were investigated by AFM at the nanometer
scales. Compared with DLC film and silicon wafers, they demonstrate an extremely
low friction coefficient at the nanometer scale about 0.03–0.04. The effect of the surface
topography on the friction coefficient is obvious for the aligned CNT film sliding at the
nanometer scale. This implies that the excellent tribological properties of the vertically
aligned CNT films, combined with their small dimensions and structural perfection, might
lead to significant improvement of the performance of nano-devices.
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