Gaya APA

Li, J. et al (2012). Characterization of semiconductor surface conductivity by using microscopic four-point probe technique . New York: Elsevier B.V..

Gaya MLA

Li, J.C.. et al. "Characterization of semiconductor surface conductivity by using microscopic four-point probe technique". New York: Elsevier B.V., 2012. e-journal.