Gaya APA

Panta, G, P., Subedi, D, P. (2012). Electrical Characterization Of Aluminum (Al) Thin Films Measured By Using Four- Point Probe Method . KATHMANDU: KATHMANDU UNIVERSITY.

Gaya MLA

Panta, G., P.., Subedi, D., P.. "Electrical Characterization Of Aluminum (Al) Thin Films Measured By Using Four- Point Probe Method". KATHMANDU: KATHMANDU UNIVERSITY, 2012. e-journal.