Gaya APA

[et.al.], C, S, C. (2015). A Compact Test Structure for Characterizing Transistor Variability Beyond 3σ (VOL. 28, NO. 3, AUGUST 2015). : IEEE.

Gaya MLA

[et.al.], Christopher, S., Chen. "A Compact Test Structure for Characterizing Transistor Variability Beyond 3σ". VOL. 28, NO. 3, AUGUST 2015 : IEEE, 2015. e-journal.