e-journal

Hamming SEC-DAED and Extended Hamming SEC-DED-TAED Codes Through Selective Shortening and Bit Placement

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Radiation particles can impact registers or memories creating soft errors. These errors can modify more than one bit causing a multiple cell upset (MCU) which consists of errors in registers or memory cells that are physically close. These MCUs can affect a single word, producing adjacent bit errors. Hamming codes are commonly used to protect memories or registers from soft errors. However, when multiple errors occur, a Hamming code may not detect them. In this letter, single-error-correction double adjacent error detection Hamming codes
are presented for 16-, 32-, and 64-bit words. Additionally, single-errorcorrection double-error-detection triple adjacent error detection codes based on extended Hamming are presented as well. The enhanced detection
is achieved by performing a selective shortening and reordering of the Hamming matrix so adjacent errors result in a syndrome that does not match that of any single error. These codes will help in the detection of MCUs in SRAM memory designs.

Index Terms: Error correction codes (ECCs), Hamming codes, memory, multiple cell upsets (MCUs).

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Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

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Penerbit

New York : IEEE., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

DOI: 10.1109/TDMR.20

Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL. 14, NO. 1, MARCH 2014

Subjek

ELEKTRONIK

Info Detail Spesifik

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Pernyataan Tanggungjawab

agus

Versi lain/terkait

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