Gaya APA

He, Q, P., Wang, J. (2007). Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes (VOL. 20, NO. 4, NOVEMBER 2007). : IEEE.

Gaya MLA

He, Q., Peter., Wang, Jin. "Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes". VOL. 20, NO. 4, NOVEMBER 2007 : IEEE, 2007. e-journal.