Gaya APA

Semenov, O. et al (2002). Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits (VOL. 15, NO. 1, FEBRUARY 2002). : IEEE.

Gaya MLA

Semenov, Oleg. et al. "Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits". VOL. 15, NO. 1, FEBRUARY 2002 : IEEE, 2002. e-journal.