Gaya APA

Bashir, M, M., Milor, L. (2015). Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth Effect in Full Chip Lifetime Analysis (VOL. 28, NO. 1, FEBRUARY 2015). : IEEE.

Gaya MLA

Bashir, Muhammad, M.., Milor, Linda. "Impact of Linewidth on Backend Dielectric TDDB and Incorporation of the Linewidth Effect in Full Chip Lifetime Analysis". VOL. 28, NO. 1, FEBRUARY 2015 : IEEE, 2015. e-journal.