Elibrary Perpustakaan Universitas Riau

Ebook, artikel jurnal dan artikel ilmiah

  • Beranda
  • Informasi
  • Berita
  • Bantuan
  • Pustakawan
  • Area Anggota
  • Pilih Bahasa :
    Bahasa Arab Bahasa Bengal Bahasa Brazil Portugis Bahasa Inggris Bahasa Spanyol Bahasa Jerman Bahasa Indonesia Bahasa Jepang Bahasa Melayu Bahasa Persia Bahasa Rusia Bahasa Thailand Bahasa Turki Bahasa Urdu

Pencarian berdasarkan :

SEMUA Pengarang Subjek ISBN/ISSN Pencarian Spesifik

Pencarian terakhir:

{{tmpObj[k].text}}
No image available for this title
Penanda Bagikan

e-journal

In Search of “Forever,” Continued Transistor Scaling One New Material at a Time

Scott E. Thompson [et.al.] - Nama Orang;

Abstract
This work looks at past, present, and future material changes for the metal–oxide–semiconductor field-effect transistor (MOSFET). It is shown that conventional planar bulk MOSFET channel length scaling, which has driven the industry for the last 40 years, is slowing. To continue Moore’s law, new materials and structures are required. The first major material change to extend Moore’s law is the use of SiGe at the 90-nm technology generation to incorporate significant levels of strain into the Si channel for
20%–50% mobility enhancement. For the next several logic technologies, MOSFETs will improve though higher levels of uniaxial process stress. After that, new materials that address MOSFET poly-Si gate depletion, gate thickness scaling, and alternate device structures (FinFET, tri-gate, or carbon nanotube) are possible technology directions. Which of these options are implemented depends on the magnitude of the performance benefit versus manufacturing complexity and cost. Finally, for future material changes targeted toward enhanced transistor performance, there are three key points: 1) performance enhancement options need to be scalable to future technology nodes; 2) new transistor features or structures that are not additive with current enhancement concepts may not be viable; and 3) improving external resistance appears more important than new channel materials (like carbon
nanotubes) since the ratio of external to channel resistance is approaching 1 in nanoscale planar MOSFETs.

Index Terms—CMOS, metal–oxide–semiconductor field-effect transistor (MOSFET), new materials, strained silicon, very large scale integration (VLSI)


Ketersediaan

Tidak ada salinan data

Informasi Detail
Judul Seri
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 18, NO. 1, FEBRUARY 2005
No. Panggil
-
Penerbit
: IEEE., 2005
Deskripsi Fisik
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 18, NO. 1, FEBRUARY 2005
Bahasa
English
ISBN/ISSN
0894-6507
Klasifikasi
-
Tipe Isi
-
Tipe Media
-
Tipe Pembawa
-
Edisi
VOL. 18, NO. 1, FEBRUARY 2005
Subjek
SEMIKONDUKTOR
Info Detail Spesifik
-
Pernyataan Tanggungjawab
ETY
Versi lain/terkait

Tidak tersedia versi lain

Lampiran Berkas
  • In Search of “Forever,” Continued Transistor Scaling One New Material at a Time
Komentar

Anda harus masuk sebelum memberikan komentar

Elibrary Perpustakaan Universitas Riau
  • Informasi
  • Layanan
  • Pustakawan
  • Area Anggota

Tentang Kami

As a complete Library Management System, SLiMS (Senayan Library Management System) has many features that will help libraries and librarians to do their job easily and quickly. Follow this link to show some features provided by SLiMS.

Cari

masukkan satu atau lebih kata kunci dari judul, pengarang, atau subjek

Donasi untuk SLiMS Kontribusi untuk SLiMS?

© 2025 — Senayan Developer Community

Ditenagai oleh SLiMS
Pilih subjek yang menarik bagi Anda
  • Karya Umum
  • Filsafat
  • Agama
  • Ilmu-ilmu Sosial
  • Bahasa
  • Ilmu-ilmu Murni
  • Ilmu-ilmu Terapan
  • Kesenian, Hiburan, dan Olahraga
  • Kesusastraan
  • Geografi dan Sejarah
Icons made by Freepik from www.flaticon.com
Pencarian Spesifik
Kemana ingin Anda bagikan?