Gaya APA

Tuohy, G. (2015). Regression Analysis of Low Kill Potential Defect Mechanisms (Moving Beyond Contingency Analysis) (VOL. 28, NO. 2, MAY 2015). : IEEE.

Gaya MLA

Tuohy, Garry. "Regression Analysis of Low Kill Potential Defect Mechanisms (Moving Beyond Contingency Analysis)". VOL. 28, NO. 2, MAY 2015 : IEEE, 2015. e-journal.