Gaya APA

Lee, T., Kim, C, O. (2015). Statistical Comparison of Fault Detection Models for Semiconductor Manufacturing Processes (VOL. 28, NO. 1, FEBRUARY 2015). : IEEE.

Gaya MLA

Lee, Taehyung., Kim, Chang, Ouk. "Statistical Comparison of Fault Detection Models for Semiconductor Manufacturing Processes". VOL. 28, NO. 1, FEBRUARY 2015 : IEEE, 2015. e-journal.