Gaya APA

Yu, J., Lu, X. (2016). Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis (VOL. 29, NO. 1, FEBRUARY 2016). : IEEE.

Gaya MLA

Yu, Jianbo., Lu, Xiaolei. "Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis". VOL. 29, NO. 1, FEBRUARY 2016 : IEEE, 2016. e-journal.