Gaya APA

[et.al.], C, H, A. (2015). Characterization of Oxide-Coated Polysilicon Disk Resonator Gyroscope Within a Wafer-Scale Encapsulation Process (VOL. 24, NO. 6, DECEMBER 2015). : IEEE.

Gaya MLA

[et.al.], Chae, Hyuck, Ahn. "Characterization of Oxide-Coated Polysilicon Disk Resonator Gyroscope Within a Wafer-Scale Encapsulation Process". VOL. 24, NO. 6, DECEMBER 2015 : IEEE, 2015. e-journal.