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Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

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This paper reports on the supply voltage dependency of single-event transient (SET) propagation and multinode charge collection phenomena in integrated circuits. We have found that the SET pulsewidth propagating to subsequent stages in a circuit may decrease with reduced power supply voltage, which runs
counter to the general conclusion that ultralow power applications are much more susceptible to disruption from a particle strike. This effect provides the circuit designers a guidance to reconsider
the impact of voltage on SET pulsewidth. Index Terms—Multinode charge collection, single-event transient
(SET), subthreshold, ultralow power voltage.

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Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

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Penerbit

: ., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

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Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL. 14, NO. 1

Subjek

TEKNIK

Info Detail Spesifik

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Pernyataan Tanggungjawab

yuli/agus

Versi lain/terkait

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