A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

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A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

Yankang Du - Nama Orang; Shuming Chen - Nama Orang; Jianjun Chen - Nama Orang;

Multiple single-event transients (MSETs) are evaluated from the perspective of sensitive area. First, a simple model is proposed to analyze the sensitive area of simple logic cells. Based on this simple model, the vulnerabilities of MSETs sensitive areas are then calculated. At last, a layout-level approach is designed to reduce the vulnerabilities of the MSETs sensitive areas. Our simulation results present that this layout-level approach could efficiently reduce the occurrence chance of MSETs.
Index Terms—Layout, multiple single-event transients (MSETs), sensitive area, vulnerabilities.

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Judul Seri: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
No. Panggil: -
Penerbit: New York : IEEE., 2014
Deskripsi Fisik: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014
Bahasa: English
ISBN/ISSN: 1530-4388
Klasifikasi: -
Tipe Isi: -
Tipe Media: -
Tipe Pembawa: -
Edisi: VOL. 14, NO. 1
Subjek: TEKNIK
Info Detail Spesifik: -
Pernyataan Tanggungjawab: yuli/agus

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