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Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan Delay Testing

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The last few years have seen the development and fabrication of nanoscale circuits at high density and low power. Following a single-event upset (SEU), so-called soft errors due to internal and externally induced phenomena (such as α-particles and cosmic rays in adverse environments) have been reported
during system operation; this is especially deleterious for storage elements such as flip-flops. To reduce the impact of a soft error on flip-flops, hardening techniques have been utilized. This paper
proposes two new slave latches for improving the SEU tolerance of a flip-flop in scan delay testing. The two proposed slave latches utilize additional circuitry to increase the critical charge of the
flip-flop compared to designs found in the technical literature. When used in a flip-flop, the first (second) latch design achieves a 5.6 (2.4) times larger critical charge with 11% (4%) delay and
16% (9%) power consumption overhead at 32-nm feature size, as compared with the best design found in the technical literature. Moreover, it is shown that the proposed slave latches have also superior performance in the presence of a single event with a multiple-node upset.
Index Terms—Radiation hardening, soft error, flip-flop, singleevent upset (SEU).

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Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

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Penerbit

New York : IEEE., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

1530-4388

Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL. 14, NO. 1, MARCH 2014

Subjek

TEKNIK

Info Detail Spesifik

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Pernyataan Tanggungjawab

yuli/agus

Versi lain/terkait

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