Gaya APA

[et.al.], J, Z. (2014). Failure Analysis of Superjunction VDMOS Under UIS Condition (VOL. 14, NO. 1, MARCH 2014). New York: IEEE.

Gaya MLA

[et.al.], Jing, Zhu. "Failure Analysis of Superjunction VDMOS Under UIS Condition". VOL. 14, NO. 1, MARCH 2014 New York: IEEE, 2014. e-journal.