e-journal

Failure Analysis of Superjunction VDMOS Under UIS Condition

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The failure mechanisms for two kinds of the 750-V Superjunction VDMOS (SJ-VDMOS) devices with different
charge imbalance conditions (Qp < Qn and Qp > Qn) under unclamped inductive switching (UIS) condition are investigated in detail by experiments and 2-D devices simulations in this paper. For Qp < Qn, only the channel current appears in the device during the UIS turn-off process, and the avalanche current appears
after the device turns off. Finally, the parasitic transistor of the device is triggered when the drain voltage reaches the BVOFF, so the device fails. Unlike Qp < Qn, the SJ-VDMOS device fails before its drain voltage reaches the BVOFF for the condition of Qp > Qn. Not only the channel current but also the
avalanche current caused by ON-state breakdown appears during the UIS turn-off process until the gate voltage decreases below the threshold voltage in the SJ-VDMOS device. The avalanche current flows beneath the n+ region and leads to the activation of the parasitic transistor.
Index Terms—Avalanche robust, charge imbalance, superjunction vertical diffused metal–oxide semiconductor (VDMOS), unclamped inductive switching (UIS).

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Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

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Penerbit

New York : IEEE., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

1530-4388

Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL. 14, NO. 1, MARCH 2014

Subjek

TEKNIK

Info Detail Spesifik

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Pernyataan Tanggungjawab

Yuli/Agus

Versi lain/terkait

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