e-journal

Usage of Laser Timing Probe for Sensing of Programmed Charges in EEPROM Devices

---

A method to measure programmed charges in EEPROM devices is presented. The measurement of the charges was
made with subtraction of images captured using a laser timing probe. The effect of the charges is expressed over the captured images due to the plasma dispersion effect.
Index Terms—Measurement by laser beam, measurements technique, microscopy, optics.

---

Ketersediaan

Tidak ada salinan data

Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

-

Penerbit

New York : IEEE., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

1530-4388

Klasifikasi

-

Tipe Isi

-

Tipe Media

-

Tipe Pembawa

-

Edisi

VOL. 14, NO. 1, MARCH 2014

Subjek

TEKNIK

Info Detail Spesifik

-

Pernyataan Tanggungjawab

Yuli/Agus

Versi lain/terkait

Lampiran Berkas

Komentar

---

Anda harus masuk sebelum memberikan komentar