Gaya APA

Wang, X. et al (2015). A Run-to-Run Profile Control Algorithm for Improving the Flatness of Nano-Scale Products (VOL. 12, NO. 1, JANUARY 2015). New York: IEEE.

Gaya MLA

Wang, Xin. et al. "A Run-to-Run Profile Control Algorithm for Improving the Flatness of Nano-Scale Products". VOL. 12, NO. 1, JANUARY 2015 New York: IEEE, 2015. e-journal.