Gaya APA

Sahoo, K, C., Oates, A, S. (2014). Dielectric Breakdown of Al2O3/HfO2 Bi-Layer Gate Dielectric (VOL. 14, NO. 1, MARCH 2014). New York: IEEE.

Gaya MLA

Sahoo, Kartika, Chandra., Oates, Anthony, S.. "Dielectric Breakdown of Al2O3/HfO2 Bi-Layer Gate Dielectric". VOL. 14, NO. 1, MARCH 2014 New York: IEEE, 2014. e-journal.