Gaya APA

[et.al.], Q, Q. (2014). Linear Drain Current Degradation of FG-pLEDMOS Transistor Under Pulse Gate Stress With Different Rising and Falling Edges (VOL. 14, NO. 1, MARCH 2014). New York: IEEE.

Gaya MLA

[et.al.], Qinsong, Qian. "Linear Drain Current Degradation of FG-pLEDMOS Transistor Under Pulse Gate Stress With Different Rising and Falling Edges". VOL. 14, NO. 1, MARCH 2014 New York: IEEE, 2014. e-journal.