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Performance Evaluation and Reliability Issues of Junctionless CSG MOSFET for RFIC Design

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This paper investigates the reliability issues of junctionless cylindrical surrounding-gate (JL CSG) MOSFET by employing temperature variations, ranging from 200 K to 500 K, along with the influence of interface trap charges. Furthermore, the analog/RF performance evaluation and linearity distortion
analysis due to the interface trap charges in terms of figure-of-merit metrics, i.e., drain current Ids; intrinsic gain (gm/gd) Ion/Ioff ; cutoff frequency fT ; gain; gain transconductance frequency product; IMD3; VIP2; VIP3; IIP3; and higher order transconductance coefficients gm1, gm2, and gm3 of JL
CSG MOSFET have been carried out. A direct comparative study in terms of performance degradation is made between gate material engineered (GME) and single-material gate (SMG) JL CSG MOSFET using ATLAS 3-D device simulator. Simulation results reveal that a GME JL transistor shows better immunity against
the influence of interface trap charges and exhibits significant enhancement to maintain device linearization, as compared to an SMG JL CSG MOSFET, so that it can be used as a high-efficiency
linear radio-frequency integrated-circuit design and wireless applications. Also from simulation study, degrading effects in JL CSG MOSFET are more pronounce at low temperature and subthreshold region. Apart from analog/RF performance, trap charges change the temperature sensitivity coefficient of the drain
current and zero crossover point.
Index Terms—Cylindrical surrounding gate (CSG), figure of merit (FOMs), gain transconductance frequency product (GTFP),gate material engineering (GME), junctionless transistor (JL).

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Informasi Detail

Judul Seri

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

No. Panggil

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Penerbit

New York : IEEE., 2014

Deskripsi Fisik

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014

Bahasa

English

ISBN/ISSN

1530-4388

Klasifikasi

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Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL. 14, NO. 1, MARCH 2014

Subjek

TEKNIK

Info Detail Spesifik

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Pernyataan Tanggungjawab

Yuli/Agus

Versi lain/terkait

Lampiran Berkas

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