Gaya APA

Cha, S., Yoon, H. (2014). Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories (VOL. 14, NO. 1, MARCH 2014). New York: IEEE.

Gaya MLA

Cha, Sanguhn., Yoon, Hongil. "Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories". VOL. 14, NO. 1, MARCH 2014 New York: IEEE, 2014. e-journal.