Electrical Characterization of Test Sockets With Novel Contactors

Novel spring contactors were designed and characterized for wafer-level interposer and high-speed package test system applications, especially for wafer-level packages. These contactors can be used as replacement for vertical wafer probes as well as test sockets used in the final test. The contactor pin consists of a plunger section made of beryllium copper and a plated helical stainless steel …