Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Er…

The erratic bits (EB) phenomenon in nonvolatile memory devices (NVMs) has been evidenced in several technologies as a main reliability detractor. Usually, this issue is handled by repair strategies, which spans from static redundancy to dynamic correction codes. This evidences a tradeoff in a reliability/ performance domain that is due to the limitation in the repair resources amount and corre…