Non-destructive assessment of ZnO:Al window layers in advanced Cu(In,Ga)Se2 p…

The increasing importance of the Cu(In,Ga)Se2 based thin films photovoltaic industry claims for the development of new assessment and monitoring tools to answer the needs existing in the improvement of the control of the processes involved in the production of solar cells modules. In this frame, a strong interest has been given to the development methodologies for the assessment of the CIGS ab…