Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simulta…

In this paper, a new single-error-correction and double-adjacent-error-correction (SEC-DAEC) code is proposed for simultaneous testing of the most general memory fault models in both data bit and check bit arrays of memories. Simultaneous testing of data bit and check bit arrays eliminates the test time and hardware overheads required for separate check bit array tests. In order to test data b…