A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interfer…

Abstract Limited endurance of E/W cycles is a unique restriction of flash memories and the endurance characteristics usually take a longer time to test. In this paper, we proposed a novel endurance test scheme that takes advantage of the parasitic cell-to-cell interference as well as a shortened program time to accelerate the endurance test for terabit NAND flash memory. The novelty of the ne…