Ditapis dengan
Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufactu…
Abstract It has been recognized that effective fault detection techniques can help semiconductor manufacturers reduce scrap, increase equipment uptime, and reduce the usage of test wafers. Traditional univariate statistical process control charts have long been used for fault detection. Recently, multivariate statistical fault detection methods such as principal component analysis (PCA)-based…
- Edisi
- VOL. 20, NO. 4, NOVEMBER 2007
- ISBN/ISSN
- 0894-6507
- Deskripsi Fisik
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 20, NO. 4, NOVEMBER 2007
- Judul Seri
- IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 20, NO. 4, NOVEMBER 2007
- No. Panggil
- -
Efficient preparation of silver nanoplates assisted by non-polar solvents
Abstract. In the paper, we report an efficient method to prepare high yield (up to 97%) of silver nanoplates. Synthesis of silver nanoplates was carried out in a binary solvent system of N,N-dimethylformamide (DMF) and toluene, in which DMF served as the reductant and polyvinylpyrrolidone (PVP) as the capping agent. By increasing the ratio of toluene to DMF to 7:6, silver nanoplates can be …
- Edisi
- -
- ISBN/ISSN
- -
- Deskripsi Fisik
- Journal of Colloid and Interface Science 331 (2009) 384–388
- Judul Seri
- Journal of Colloid and Interface Science
- No. Panggil
- -
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