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Ditemukan 1 dari pencarian Anda melalui kata kunci: author=Peiyong Zhang [et.al.]
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Analysis and Characterization of Capacitance Variation Using Capacitance Meas…
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Peiyong Zhang [et.al.]

Abstract To address the need for direct extraction of the capacitance of a chip, a capacitance measurement array (CMA) has been developed. The operation of the CMA is based on the charge-based capacitance measurement (CBCM) technique. The CMA chip consists of 144 CBCM array units (CAU) and each CAU is designed to measure eight individual capacitors. Element selection and precise measurement ar…

Edisi
VOL. 27, NO. 2, MAY 2014
ISBN/ISSN
0894-6507
Deskripsi Fisik
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 27, NO. 2, MAY 2014
Judul Seri
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 27, NO. 2, MAY 2014
No. Panggil
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