AC Variability and Endurance Measurement Technique for Resistive Switching Me…

Variability in resistive switching memory (RRAM) devices is studied by applying an AC measurement setup capable of efficiently collecting read current data in low and high resistance states (LRS and HRS, respectively) in each consecutive pulse SET/RESET cycle. It is found that HRS and LRS read current values follow the lognormal and normal distributions, respectively. Endurance test demonstrat…