Design and Analysis of Single-Event Tolerant Slave Latches for Enhanced Scan …

The last few years have seen the development and fabrication of nanoscale circuits at high density and low power. Following a single-event upset (SEU), so-called soft errors due to internal and externally induced phenomena (such as α-particles and cosmic rays in adverse environments) have been reported during system operation; this is especially deleterious for storage elements such as flip-f…