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Ditemukan 1 dari pencarian Anda melalui kata kunci: author=Yogesh Pratap [et.al.]
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Performance Evaluation and Reliability Issues of Junctionless CSG MOSFET for …
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Yogesh Pratap [et.al.]

This paper investigates the reliability issues of junctionless cylindrical surrounding-gate (JL CSG) MOSFET by employing temperature variations, ranging from 200 K to 500 K, along with the influence of interface trap charges. Furthermore, the analog/RF performance evaluation and linearity distortion analysis due to the interface trap charges in terms of figure-of-merit metrics, i.e., drain cur…

Edisi
VOL. 14, NO. 1, MARCH 2014
ISBN/ISSN
1530-4388
Deskripsi Fisik
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, VOL. 14, NO. 1, MARCH 2014
Judul Seri
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
No. Panggil
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